By Joe Kelly
That includes important enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its style source deals skilled engineers a entire knowing of the complicated themes in RF, SiP (system-in-package), and SoC (system-on-a-chip) construction checking out which are severe to their paintings related to semiconductor units. The booklet covers key dimension innovations for semiconductor equipment checking out and assists engineers in explaining those thoughts to administration to help cut back venture fee, time, and assets. according to real-world event and full of time-saving equations, this in-depth quantity bargains pros useful details on crucial issues that experience by no means been awarded in one reference earlier than.
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Extra info for Advanced Production Testing of RF, SoC, and SiP Devices
The all-encompassing term sensitivity is used with a receiver because it is possible to measure the full functionality of the SoC device. One such example sensitivity test is to provide modulated Concepts of Production Testing of RF, SoC, and SiP Devices 15 RF signals to the input of the receiver. The baseband output is then analyzed at different input power levels to determine when the data becomes corrupted because of noise introduced during the receiver downconversion process. 5 Testing Transmitters The counterpart to the receiver, the transmitter, performs upconversion on analog baseband signals to produce an RF output from a device.
Because the power amplifier is the device that has the highest current consumption in a mobile phone, for instance, systems and design engineers pay a lot of attention to PAE because this Tests and Measurements I: Fundamental RF Measurements 33 is the main factor that causes the battery to drain and therefore reduces a mobile phone’s usable time before it has to be recharged. References  Agilent Technologies, “S-Parameter Design,” Application Note 154, 2000. html. , and J. Kelly, Production Testing of RF and SoC Devices for Wireless Communications, Norwood, MA: Artech House, 2004.
The simplest example of an active two-port device would be an amplifier. 1 is the voltage wave that is applied to the input of the device. Likewise, the a2 signal is a voltage wave that is applied to the output of the device; b1 is the voltage wave that can be measured at the input of the device; and b2 is the voltage wave that can be measured at the output of the device. 1 S-parameter definition for a two-port device showing incident and reflected signals. 4) Under the assumption that the output of the two-port device is terminated (a2 = 0), S11 is called the input reflection coefficient.